Angstrom Scientific Inc.

Angstrom Scientific Inc.

Angstrom Scientific Inc. represents leading manufacturers supporting materials characterization. Specifically: Hitachi Tabletop SEMs, Imina Nano-probing systems, Point Electronics EBIC/EBAC, Leica Sample prep equipment, NenoVision and Alemnis In-Situ AFM, & Nano-Indenters, EMSIS TEM Cameras, Advent Diamond X-ray Beam Monitor, ConnectomX – Katana Microtome, VacuumFab motion control and Noble Dome Air-Free Transfer System.

2004

Atomic Force Microscopes, Camera / Digital Camera Systems - CDC, CMOS, Megapixel, Critical Point Dryers, CryoEM Sample Handling, CryoEM Sample Preparations, Cryoequipment, Detectors, EDS Detectors & Systems, Electrical Characterization, Failure Analysis, FIB accessories, Micromanipulators, Microprobes, Microtomes and Ultramicrotomes, Nano Indentation, Nanopositioners & Stages, Nanoprobes / Mechanical Microprobes, Scanning Electron Microscopes (SEM), SEM Accessories, SEM Stages, Mounts and Holders, Specimen Preparation & Handling, Surface Analysis, Surface Profiling, Tabletop SEM/TEM, TEM Accessories, Vacuum Equipment, X-ray Analysis Equipment