Name
GenISys, Inc.
What We Do
We provide flexible, high-performance software solutions for the optimization of micro and nano fabrication as well as metrology and inspection, to give engineers, manufacturers, and tool suppliers unparalleled efficiency and optimal value in research, development, and production of future nano technologies.

InSPEC is our new SEM metrology and inspection solution connecting to a SEM through digital and analog interfaces providing full control of beam shaping, stage navigation, and image scanning. Advanced multi-chip jobs become possible with the integrated workflow of scanning, contour detection, corrections, and data processing. InSPEC is the upgrade kit for your SEM to convert it into a versatile and sophisticated metrology tool for supporting nanofabrication of novel patterns and devices.

ProSEM provides versatile and consistent offline analysis for metrology and inspection, in particular for SEM images, with advanced contour detection and great ease-of-use. ProSEM helps getting more results from your images and improves the utilization of the SEM with automated image acquisition and metrology.
Founded
2005
Categories
E Beam Lithography, Image Analysis and Processing, SEM Accessories, Software
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Address
PO Box 410956
San Francisco, CA 94141-0956
United States

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