Name
Hitachi High-Tech America, Inc.
Categories
Atomic Force Microscopes, Dual Beam FIB/SEM, Focused Ion Beam Systems / Workstations, Image Analysis and Processing, Nanoprobes / Mechanical Microprobes, Scanning Electron Microscopes (SEM), Scanning Transmission Electron Microscopes (STEM), SEM Stages, Mounts and Holders, Tabletop SEM/TEM, Transmission Electron Microscopes (TEM)
Address
22610 Gateway Center Dr - Ste 100
Clarksburg, MD 20871
United States

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